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Discussion Starter · #1 ·
I was having a 501 problem and tech support suggested checking the status of the non-volatile memory. The test is activated by entering the Diagnostics screen then:

Press Info 2 times
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Next a memory map screen is displayed. The notice was the non-volaeile was corrupted. The tech said to power down the system for 15 minutes and do the check again. If the memory was still corrupt the unit is defective.

I hung up the phone, powered down the system for the requisite 15 minutes, repowered, performed the memory check and it showed corrupted non-volatile memory again. I repeated the test two more times with the same result.

I called tech support back, reported the results and the tech I got this time told me it was "normal" to get a corrupted memory message everytime you run the test. What the hell is this?

I haven't called back, thought I'd ask around a couple of the forums to see what kind of information I can glean. I've been an engineer all my life, now retired, and I have never designed a test with a response like that or heard of one like that either.

When I was describing the problem originally I told the tech that the problem only occured on the 501, the two 3800s were fine. He tells me that the 501 is designed with new "more sensitive" circuitry that will be affected by signal problems more so than the old technology 3800s. What the hell is this? People with a little knowledge can be dangerous,

Then it turns out the porblem was apparently caused by some "adjustments" they were making to the Orlando locals!

My main question is about the non-volatile memory test. Anyone know how it is "supposed" to work?

Thanks....
 
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